Semiconductor Reliability Test
Device reliability is determined during the manufacturing process just like all characteristics are shaped by genetic factors inside womb. So, a reliability prediction system without reliability evaluation through an Artificial Intelligence algorithm that learned Device Physics and Reliability Model.
In Industrty team, Over 180 pieces of expensive reliability measurement equipment ,Consumes ~1300 test wafers per year, 200 reliability engineers deployed, Average 3.2 months WLR/PLR reliability evaluation time, WLR (HCI/BTI/TDDB/ Vramp): Takes 4 weeks
In Contrast, For WLR (HCI/BTI/TDDB/ Vramp), Two Scientists Completed in 2 Hours through Semiconductor Genetic Analysis A.I. In Conventional 4 WLR tests take 30 days, but we make 2 hours to test up to Accuracy 96~98% .
There are no companies that process or are developing this technology. So we are going to apply for a patent in six countries. We already registered Korean Patent.